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Application Notes

Materials Analyses - Solar cell, Fuel cell components and starting materials

TEM applications - Metrology and Materials characterization

Chemical Analyses - Organic and Inorganic Contamination analysis

Surface Science - Film Thickness measurements by X-ray Reflection
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Dr. Tim Hossain will be presenting at the 2010 Photovoltaics World Conference and Expo on February 23-25, 2010 in Austin,TX.  Dr. Hossain will be discussing analysis of bulk silicon by NAA and SIMS.
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