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Topography of Hydrophilic Contact Lens in Liquid Environment

 Atomic force microscopy (AFM) is a nondestructive, nanometer scale, surface metrology technique with applications in various industries.  Utilizing an additional scanner accessory enables the Cerium Laboratories’ AFM to perform surface measurement when samples are moist or completely immersed within a liquid.  This is an important capability where a soft or wet surface requires analysis reflecting the conditions of real time use.  For example, a hydrophilic polymer immersed in water or saline experiences comparable conditions to a contact lens being worn by a consumer.  The measured lens’ topography may be presented in either 2D or 3D image representations.  Using software, polymer defects, peak-to-peak values and root-mean-square (RMS) surface roughness are quantifiable.  The polymer surface is not damaged during examination allowing further experimentation and/or analysis after AFM measurement.

Figure 1 shows 2D and 3D representations, left and right respectively, of AFM data obtained from a commercially available soft contact lens in contact mode.  The data was obtained while the lens was fully immersed in deionized water.  The dark red lines and white spots are typical surface features of contact lens.  Polymer defects are observable in a similar manner during imaging.  Figure 2 is a plot of multiple RMS surface roughness measurements from the same data.  The internal software algorithm uses RMS which prevents weighting during the average.  The AFM roughness precision is of high quality since scans were obtained at various points across the random surface and the instrument has a ± 0.1 nm uncertainty.

 

 

 

 

Figure 1:  20 × 20 µm area, vertical scale bar is 25 nm, 2D (left), 3D (right).

 

 

 

 

 

 

Figure 2:  Multiple RMS surface roughness measurements, 20 × 20 µm area, horizontal line represents the average RMS surface roughness at 2.5 nm.

• Cerium Laboratories’ AFM is a Digital Instruments Dimension 5000 AFM accepting samples up to 200 mm diameter and 1 cm height.  Measurement capabilities include contact mode and the more versatile TappingMode (TM).




Tom Schamp, Berdie Valdez and Jerzy Gazda of Cerium Labs have published an article in Microscopy Today, Vol.16 entitled "Quick Sample Preparation and EFTEM Elemental Characterization of FAB Based Defects."

In conjunction with the University of Hawaii, Cerium Labs will be presenting a paper entitled "The Impacts of Repetitive Carbon Monoxide Poisoning on Performance and Durability of a Proton Exchange Membrane Fuel Cell" at the ECS PRiME meeting, Oct 12-17, 2008.

Jerzy Gazda of Cerium Labs will present a poster at the 2008 Fuel Cell Seminar entitled “Preparation of Membrane Electrode Assemblies for Examination by SEM, TEM, XPS, and FTIR”.

 

Michael Benjamin of Cerium Labs will be presenting a paper entitled "Measurement of Platinum Content in Membrane Electrode Assemblies using Inductively Coupled Plasma - Optical Emission Spectroscopy"at TMS 2009 Annual Meeting in February. 

 

 

Upcoming Events

AVS Symposium & Exhibit, Oct 19-24

2008 Fuel Cell Seminar, Oct 27-31

 


Steve Tweedy, manager of Cerium Laboratories’ Analytical Chemistry Section, leads a group of chemists specializing in a variety of spectroscopic techniques including VPD, HR-ICPMS, ICP-OES, IC, WDXRF, FTIR, GCMS and UV-Vis.  After receiving his BS degree in Chemistry from Southwest Texas State University, Steve held technical positions with the Bureau of Economic Geology at the University of Texas and with Advanced Micro Devices before assuming his current role at Cerium Labs.

Steve has extensive experience with quality programs and was instrumental in obtaining Cerium’s ISO/IEC 17025:2005 accreditation.  In particular, he helped with development of Cerium’s management systems and was responsible for defining the VPD analysis protocols.  Steve continues to be active in developing new and improved analytical methods, along with supporting a variety of chemical and environmental monitoring activities for wafer fab operations and other clean manufacturing applications.

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