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Materials Analysis with Raman Spectroscopy

Typical applications of Raman spectroscopy include contamination identification, chemical phase characterization and compositional analysis. Comparing the unique spectrum of an unknown material to a spectral database enables identification of unknown contaminants.  Spectra from several common polymers used in semiconductor device packaging are shown in Figure 1.

 

 Fig 1. Raman spectra of common organic polymers. 

Using Raman spectroscopy, Cerium Labs analyzed raw materials used to manufacture Solid Oxide Fuel Cells to verify their crystalline phase.  Figure 2 shows a spectrum of yttria-stabilized zirconia (YSZ) that is a mixture of tetragonal and cubic phases.  Metal silicides used in microelectronics fabrication show conversion from metal rich to silicon rich phases.  Each of these phases has a distinct Raman spectrum that is used to monitor the conversion process.

 

Fig 2. Raman spectrum of YSZ showing a mixture of the tetragonal and cubic phases.

Raman spectroscopy is also used to determine the purity of single-walled (SW) and multi-walled (MW) carbon nanotubes.  Figure 3 shows a spectrum of a SW carbon nanotube sample.  Purity of the nanotubes in solution is determined by the presence or absence of the carbon D band at 1350 cm-1.

 

Fig 3. Raman spectrum of single walled carbon nanotubes.

Raman Spectroscopy is an inelastic light scattering technique that measures the vibrational spectra of molecules.  Cerium Labs operates a Renishaw Micro-Raman Spectrometer with multiple excitation wavelengths (488 nm, 514 nm and 785 nm) giving us the ability to analyze organic and inorganic materials.  Additionally, the spatial resolution of the Raman microscope is approximately 1 micron, allowing analysis of microscopic features that are too small for analysis by other methods such as FTIR.


 

Cerium Labs offers customized solutions to support IP professionals in patent and reverse engineering investigations of electronic and semiconductor devices.        Vist our website for more information. 

Cerium Labs' IP Solutions

 

Cerium now has enhanced capabilities in Quad-SIMS with the addition of a new Oxygen-18 (O-18) source.  Since the majority of oxygen present in samples is O-16, sputtering with O-18 allows low levels of O-16 to be detected.

 

 

Michael Benjamin of Cerium Labs will be presenting a paper entitled "Measurement of Platinum Content in Membrane Electrode Assemblies using Inductively Coupled Plasma - Optical Emission Spectroscopy"at TMS 2009 Annual Meeting in February 2009. 

 

 

 

 


Tom Schamp, a senior materials engineer in the Analytical Imaging group at Cerium Laboratories, is a materials scientist specializing in analytical transmission electron microscopy.  Tom’s academic background includes a dual BS degree in Math and Physics from Lynchburg College in Virginia, along with MS and Ph.D. degrees in Materials Science from the University of Virginia where he studied size-dependent thermodynamic properties of single and two-phase multi-component metal and semiconductor nanoparticles.  During his time in graduate school, Tom was awarded an Alcoa research fellowship which took him to the University of Port Elizabeth in South Africa.

Since joining Cerium Labs Tom has published six papers and given four conference presentations based primarily on analytical TEM techniques and analysis of nanoscale defects and structures.  He has implemented TEM spectral imaging functionality involving STEM-EDXS, STEM-EELS and EFTEM datasets, as well as digital STEM image capture capability.  Tom is currently exploring hyperspectral image analysis techniques and applying them to reduce large datasets such as EFTEM spectral images and FTIR air monitoring data.

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