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Journal and Conference Publications

Microscopy and Microanalysis 2010 Conference
SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques (abstract)
C.T. Schamp, B.T. Valdez, L.K. Ballast, A. Gill, S.A.  Pierce, L. Brown, C. Brooks, E. Thompson, B. Roth

Capturing die layout of obsolete ASIC using Extreme Field of View SEM. 
Jerzy Gazda, Adam Jachniewicz, and Chris Sallee, Richard Young

Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices. 
Jerzy Gazda, Jorge Duarte, and Fawn Daby-Merrill

TMS Conference 2009
Measurement of Platinum Content in Membrane Electrode Assemblies using Industively Coupled Plasma Optical Emission Spectroscopy.
Mike Benjamin, Dan Posey, Steve Tweedy

Microscopy and Microanalysis 2009 Conference
Analysis Of “Invisible” Poly-Bump Defect With EFTEM Spectral Imaging(abstract)
C.T. Schamp, R. Rios, A. Gill

Microscopy and Microanalysis 2008 Conference
EFTEM and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device Defects
C.T. Schamp, B.T. Valdez

Microscopy Today, Vol 16 - No.2
Quick Sample Preparation and EFTEM Elemental Characterization of FAB based Defects
C.T. Schamp, B.T. Valdez, J. Gazda

Microscopy and Microanalysis 2007 Conference
Ni Catalysts for the Growth of SiO2 Nanofiber Bundles
C.T. Schamp, J. Gazda, B.T. Valdez, B. Bridgman

Fuel Cell Show 2007
Elemental and Structural Analysis Techniques for Raw Materials Used in the Manufacturing of Solid Oxide Fuel Cells
Dan Posey, Ted Neil, Lynette K. Ballast

 


 

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