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Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is an important member of a growing array of Scanning Probe Microscopy (SPM) techniques. By scanning an AFM tip of a few nanometers in diameter over a sample, a three-dimensional view of the surface topology can be obtained with a lateral resolution of 1-2 nm and a vertical resolution of 0.01 nm. The versatility of this technique allows for the measurement of several different forces, often simultaneous, for a variety of images including magnetic force, friction and capacitance. All analyses can be conducted in air without special sample preparation. Even soft, easily damaged materials such as polymers or biological specimens can be imaged. Typically, AFM is used to obtain quantitative, three-dimensional images of surfaces with ultra-high resolution. AFM provides measurements of surface roughness, grain size, and grain size distribution. SPM techniques have proven useful for incoming quality testing, process monitoring, R & D, failure analysis, and reliability testing for the semiconductor, disk drive, optical coating, polymer and biotech industries.

Instrument:
• Digital DI5000 AFM with MFM, SCM and SSRM capabilities

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