Subscribe to our
E-newsletter

BSE

Back scattered electron imaging provides you with an image based on the atomic number of the material. Higher Z elements have higher scattering cross sections and thus are brighter in the image. This type of analysis is very useful when imaging a composite sample of many different elements like Al, Cu, W and Ti.

Copyright © 2017 Cerium Labs™. All rights reserved. Austin Graphic Design by Envision Creative Group