JEM-ARM200F Transmission Electron Microscope

Cerium Labs can now offer the revolutionary benefits inherent in the world’s first third-generation Aberration Corrected Scanning Transmission Electron Microscope (AC-(S)TEM). Compared with conventional (S)TEM, the AC-(S)TEM can pack significantly more current into an order of magnitude smaller electron beam. This means sharp atomic resolution images and higher signal-to-noise ratios from analytical techniques with acquisition times of minutes rather than hours. With a sub-Angstrom probe size, atomic resolution details become accessible that one could only guess at when using conventional microscopes. The unique design of the microscope enables simultaneous acquisition of images enhancing light elements, heavy elements, and phases giving rise to strong diffracting conditions. All of this is accessible at electron beam energies desirable to both hard and soft materials from semiconductors and metals to polymers.

Our customers continue to benefit from the proven value of a highly trained and accessible technical staff, and now have the ability to access more insightful data than ever before. These added capabilities cover many different types of samples and yield data that simply can not be collected by other means. For example, our semiconductor customers can learn where contaminant atoms are in their gate dielectrics as we step across the gate one atomic column at a time, acquiring EELS and EDXS data at every point. Our catalyst customers can learn if the wrong atoms segregate to the surfaces or other boundaries in their nanoparticles and learn if unexpected phases and structures are present. For those customers growing strained Si to promote higher electron mobilities, these added capabilities permit high resolution strain maps to be acquired. Our customers who have very delicate samples such as polymeric or beam sensitive organic materials can obtain data previously considered generally unattainable such as elemental and phase maps.