[templated item][templated item][templated item][templated item][templated item][templated item][templated item]

Photovoltaics

  

Litigation Support

  

Semiconductor

 

Reverse Engineering

Bulk and surface analysis for contamination in silicon.
Solar Cell Assembly failure analysis.

  

Microscopy and analytical chemistry investigations of product failures.  IC teardown and circuit analysis for IP litigation.

  

Support for semiconductor manufacturing, process and tool qualifications, and failure analysis.

  

IC circuit extraction or recreation using series of delayering, imaging, and software tools.
more   more   more   more

Cerium Laboratories brings the elements of knowledge, experience and capability together to help you solve your most difficult analytical problems. And now we can offer the capability of the one of the world’s most advanced transmission electron microscopes, the JEM-ARM200F. JEOL’s 3rd generation Aberration Corrected Scanning TEM has a sub-angstrom probe size that is able to provide atomic resolution that conventional TEMs can not.  

Our dedicated and professional staff, with over 2 decades of experience in a multitude of analytical fields, is available to assist you with your analytical needs whether it is electron imaging or surface analysis, mass spectroscopy or chemical analysis.

One on one customer service, timely results and competitive pricing. Cerium Labs.

CERIUM EXPERT'S BLOG